Journal of the Korean Society for Nondestructive Testing (비파괴검사학회지)

The Korean Society for Nondestructive Testing (한국비파괴검사학회)
권호 표지

Out-of-Plane Deformation Measurement of TPS in Vehicle Using ESPI

ESPI를 이용한 자동차 TPS 면외변형 계측

  • 한상길 (인천대학교 물리학과) ;
  • 함효식 (인천대학교 물리학과) ;
  • 함상현 (인천대학교 물리학과) ;
  • 이종황 (현대기아자동차 그룹 내구신뢰성 팀) ;
  • 정원욱 (현대기아자동차 그룹 내구신뢰성 팀) ;
  • 이창희 (대우일렉트로닉스(주) 품질신뢰성연구소) ;
  • 이상봉 (인천대학교 물리학과) ;
  • 최성을 (인천대학교 물리학과)
  • Received : 2010.08.04
  • Accepted : 2010.10.08
  • Published : 2010.10.30
Download PDF
⟨ Previous Next ⟩

Abstract

In this paper, we analyzed the characteristics of thermal deformation of the TPS which is a core part of engine in vehicle by measuring out-of-plane deformation using ESP!. Inspection area of a test piece was minimized to 5 cm by 5 cm by using a high resolution CCD and a zoom lens. 4-step phase shifting method was used along with phase unwrapping algorithm to get a continuous phase map, configurations and deformations were displayed as 3D images. When heating the test pieces while maintaining the temperature at about $70^{\circ}C$, the out-of-plane deformations were measured. The results showed that a test piece with longer distance traveled tends to show larger thermal deformation, we could observes a convex shaped deformation on the surface. The inner defect sample, we could monitor discontinuous pattern phase map, and a concave shaped deformation on the surface.

본 논문에서는 ESPI 방법을 이용하여 자동차 엔진의 핵심 부품인 TPS의 열변형력에 따른 변외변형을 측정하여 열변형 특성을 분석하였다. 높은 해상도의 CCD와 줌렌즈를 사용하여 부품의 검사영역을 가로 세로 각각 5cm로 최소화하였다. 주행거리가 다른 TPS 부품들을 4-step 위상이동법과 위상 연속화를 통해 변형량이 연속적으로 변하는 위상도를 얻었고, 3차원으로 변형의 모양과 크기를 나타내었다. 약 $70^{\circ}C$의 온도를 유지하면서 TPS 부품에 열을 가한 경우 주행거리가 길어질수록 TPS 변형은 크게 측정되었고, 위로 볼록한 형태로 변형되었다. 그리고 내부결함이 있는 부품에서는 위상도에 불연속적인 무늬가 나타났고, 아래로 오목한 모양을 갖는 변형으로 나타났다.

Keywords

Acknowledgement

Supported by : 인천대학교

References

  1. D. Malacara, "Optical shop testing," 3rd Edition, Wiley Series in Pure and Applied Optics, pp. 409-437, John Wiley & Sons Incorporated, United States of America, (1992)
  2. N. J. Butters and J. A. Leendertz, "Speckle pattern and holographic techniques in engineering metrology," Optics and Laser Technology, Vol. 3, No.1, pp. 26-30 (1972)
  3. S. Sumi, "Speckle pattern correlation method for measurement of surface structural change caused by fatigue," The Society of Materials Japan, Vol. 56, No.7, pp. 17-21 (1976)
  4. G. H. Kaufmann, D. Kerr and N. A. Halliwell, "Contrast enhancement of pulsed ESPI addition fringes," Optics and Lasers in Engineering, Vol. 20, No.1, pp. 25-34 (1994) https://doi.org/10.1016/0143-8166(94)90039-6
  5. A. Davila, D. Kerr and G. H. Kaufmann, "Fast electro-optical system for pulsed ESPI carrier fringe generation," Optics Communications, Vol. 123, No.4, pp. 457-464 (1996) https://doi.org/10.1016/0030-4018(95)00601-X
  6. A. J. Moore and C. Perez-Lopez, "Fringe carrier methods in double-pulsed addition ESPl," Optics Communications, Vol. 141, No. 3, pp. 203-212 (1997) https://doi.org/10.1016/S0030-4018(97)00182-X
  7. P. Aswendt, C. Schmidt, D. Zielke, S. Schubert, "ESPI solution for non-contacting MEMS-on-wafer testing," Optics and Lasers in Engineering, Vol 40, No.5, pp. 501-515 (2003) https://doi.org/10.1016/S0143-8166(02)00086-6
  8. K. S. Kim, K. S. Kang, Y. J. Kang and S. K. Cheong, "Analysis of an internal crack of pressure pipeline using ESPI and shearography," Optics & Laser Technology, Vol. 35, No.8, pp. 639-643 (2003) https://doi.org/10.1016/S0030-3992(03)00111-7
  9. L. Augulis, S. Tamuleviius, R. Augulis, J. Bonneville, P. Goudeau and C. Templier, "Electronic speckle pattern interferometry for mechanical testing of thin films," Optics and Lasers in Engineering, Vol. 42, No. 1, pp. 1-8 (2004) https://doi.org/10.1016/j.optlaseng.2003.06.001
  10. R. K. Mohanty, C. Joenathan and R. S. Sirohi, "Speckle interferometric methods of measuring small out-of-plane displacements," Optics Letter. Vol. 9, No.2, pp. 475-477 (1984) https://doi.org/10.1364/OL.9.000475
  11. X. Hu and C. Hu, "Measuring in-plane and out-of-plane coupled motions of microstructures by stroboscopic microscopic interferometry," Optics and Laser Technology, Vol. 12, No.4, pp. 13-20 (2007)
  12. D. W. Robinson and D. C. Williams, "Digital phase stepping speckle interferometry," Optics Letter, Vol. 57, No. 10. pp. 26-30 (1986)
  13. S. Nakadate and H. Saito, "Fringe scanning speckle pattern interferometry," Optics Letter, Vol. 21, No.6, pp. 72-80 (1985)
  14. A. E. Dolinko and H. Kaufmann, "Measurement of the local displacement field generated by a rnicroindentation using digital speckle pattern interferometry and its application to investigate coating adhesion.," Optics and Lasers in Engineering, Vol. 47, No.5, pp. 527-531 (2009) https://doi.org/10.1016/j.optlaseng.2008.10.012
  15. U. P. Kumar, B. Bhaduri, N. Krishna Mohan, M. P. Kothiyal and A. K. Asundi, "Microscopic TV holography for MEMS deflection and 3-D surface profile characterization," Optics and Lasers in Engineering, Vol. 46, No.9, pp. 687-694 (2008) https://doi.org/10.1016/j.optlaseng.2008.04.011