Journal of the Microelectronics and Packaging Society (마이크로전자및패키징학회지)

The Korean Microelectronics and Packaging Society (한국마이크로전자및패키징학회)
권호 표지
DOI QR코드

DOI QR Code

Reliability Evaluation for Photovoltaic Modules

태양전지 모듈의 신뢰성 평가

  • ;
  • 김근수 (호서대학교 융합기술연구소)
  • Received : 2012.06.05
  • Accepted : 2012.06.11
  • Published : 2012.06.30
Download PDF
⟨ Previous Next ⟩

Abstract

Long-term reliability of Si photovoltaic modules is a crucial issue for the cost-reduction on the power-supply system. To elevate this reliability, several environmental tests have been created as qualification and certification procedures. This paper gives an overview about recent researches of reliability tests for Si photovoltaic modules.

Keywords

References

  1. Economic and Social Research Institute, Cabinet Office, Government of Japan, "総合的な經濟.エネルギ-. 環境分析に資すゐ技術情報のための硏究 (In Japanese), from http://www.esri.go.jp/jp/archive/hou/hou040/hou031.html ()2007).
  2. S. Igari and K. Morita, "Reliability of Photovoltaic Modules" (In Japanese), J. Reliability Engineering Association of Japan, 30(1), 16 (2008).
  3. The National Institute of Advanced Industrial Science and Technology (AIST), "高信頼性太陽電池モジュ-ル開發.評價コソソ-シアムを 設立 " (In Japanese), from http://www.aist.go.jp/aist_j/press_release/pr2009/pr20091021/pr20091021. html, (2009).
  4. IEC 61215, "Crystalline silicon terrestrial photovoltaic (PV) modules -Design qualification and type approval", International Electro-technical Commission, (2005).
  5. C. R. Osterwald and T. J. McMahon, "History of Accelerated and Qualification Testing of Terrestrial Photovoltaic Modules: A Literature Review", Prog. Photovoltaics: Research and Applications, 17(1), 11 (2009). https://doi.org/10.1002/pip.861
  6. H. Tanaka and K. S. Kim, "Introduction of Reliability Test Technology for Electronics Package" (In Korean), J. Microelectron. Packag. Soc., 19(1), 1 (2012). https://doi.org/10.6117/kmeps.2012.19.1.001
  7. Y. Aoki, M. Okamoto, A. Masuda and T. Doi, "Module Performance Degradation with Rapid Thermal-Cycling", Proc. Renewable Energy 2010, Yokohama, Japan, International Solar Energy Society (2010).
  8. Y. Aoki, M. Okamoto, A. Masuda, T. Doi and T. Tanahashi, "Early Failure Detection of Interconnection with Rapid Thermal- Cycling in Photovoltaic Modules", Proc. 2012 NREL PV Module Reliability Workshop, Golden, USA, National Renewable Energy Laboratory (2012).
  9. Y. Aoki, M. Okamoto, A. Masuda, T. Doi, "Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling", IEICE Technical Report. R, 110(298), 5 (2010).
  10. K. S. Kim, K. J. Lee, K. Suganuma and S. H. Huh, "Effect of Cl Content on Interface Characteristics of Isotropic Conductive Adhesives/Sn Plating Interface" (In Korean), J. Microelectron. Packag. Soc., 18(3), 33 (2011).
  11. J. H. Wohlgemuth et al., "Long term reliability of photovoltaic modules", Proc. 4th World Conference on PV Energy Conversion, Hawaii, 2050-2053, IEEE Electron Devices Society (USA) (2006).
  12. J.H. Wohlgemuth et al., "Using accelerated tests and field data to predict module reliability and lifetime", Proc. 23rd European PVSEC, Valencia, 2663-2669, (2008).
  13. C.R. Osterwald et al., "Forward-biased thermal cycling: a new module qualification test", Proc. NCPV Program Review Meeting 2000, Denver, 65-66, National Renewable Energy Laboratory (2000).

Cited by

  1. PERC 태양전지 모듈의 출력저하 방지를 위한 모스아이(Moth-eye) 광학필름 연구 vol.27, pp.4, 2012, https://doi.org/10.6117/kmeps.2020.27.4.055