DOI QR코드

DOI QR Code

Effect of Aging treatment and Epoxy on Bonding Strength of Sn-58Bi solder and OSP-finished PCB

Sn-58Bi Solder와 OSP 표면 처리된 PCB의 접합강도에 미치는 시효처리와 에폭시의 영향

  • Kim, Jungsoo (School of Advanced Materials Science & Engineering, Sungkyunkwan University) ;
  • Myung, Woo-Ram (SKKU Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University) ;
  • Jung, Seung-Boo (School of Advanced Materials Science & Engineering, Sungkyunkwan University)
  • 김정수 (성균관대학교 신소재공학부) ;
  • 명우람 (성균관대학교 나노과학기술학과) ;
  • 정승부 (성균관대학교 신소재공학부)
  • Received : 2014.12.10
  • Accepted : 2014.12.26
  • Published : 2014.12.30

Abstract

Among various lead-free solders, the Sn-58Bi solders have been considered as a highly promising lead-free solders because of its low melting temperature and high tensile strength. However, Sn-58Bi solder has the poor ductility. To enhance the mechanical property of Sn-58Bi solder, epoxy-enhanced Sn-58Bi solders have been studied. This study compared the microstructures and the mechanical properties of Sn-58Bi solder and Sn-58Bi epoxy solder with aging treatment. The solders ball were formed on the printed circuit board (PCB) with organic solderability preservative (OSP) surface finish, and then the joints were aged at 85, 95, 105 and $115^{\circ}C$ for up to 100, 300, 500 and 1000 hours. The shear test was conducted to evaluate the mechanical property of the solder joints. $Cu_6Sn_5$ intermetallic compound (IMC) layer grew with increasing aging time and temperature. The IMC layer for the Sn-58Bi epoxy solder was thicker than that for the Sn-58Bi solder. According to result of shear test, the shear strength of Sn-58Bi epoxy solder was higher than that of Sn-58Bi solder and the shear strength decreased with increasing aging time.

다양한 무연솔더합금 가운데 Sn-58Bi solder는 저융점이며 상대적으로 높은 인장강도를 갖고 있지만 취성적이라는 단점을 갖고 있다. 이러한 Sn-58Bi 솔더의 기계적 강도를 보완하기 위해 epoxy를 함유한 Sn-58Bi 솔더가 연구되어져왔다. 본 연구는 Sn-58Bi 솔더와 Sn-58Bi 에폭시 복합솔더를 이용하여 PCB 기판에 접합한 후, 시효처리에 따른 솔더/기판 계면 미세구조와 기계적 특성변화를 연구하였다. OSP 표면처리된 PCB 기판에 솔더볼을 형성 한 후 85, 95, 105, $115^{\circ}C$에서 100~1000 시간동안 시효처리하였으며, 기계적 특성평가로 저속전단시험을 진행하였다. 시효 처리 시간 및 온도의 증가에 따라 Cu6Sn5 금속간화합물층은 성장하였으며 Sn-58Bi 솔더 금속간화합물층이 Sn-58Bi 에폭시 복합솔더보다 두꺼웠다. 전단시험 결과, Sn-58Bi 에폭시 복합솔더가 Sn-58Bi 솔더보다 약 2배 높은 전단강도 값을 나타냈으며 시효시간이 증가할수록 전단강도 값은 감소하였다.

Keywords

References

  1. J. W. Yoon and S. B. Jung, "Investigation of interfacial reactions between Sn-5Bi solder and Cu substrate", J. Electron. Mater., 359, 202 (2003).
  2. J. J. Soh, D. S. Shim and W. B. Byung, "Technical trend of Restriction of Hazardous Substances Directive(RoHS) (in korean)", Conference of The Korean Institute of Electrical Engineering, 1289 (2009).
  3. J. W. Yoon, C. B. Lee and S. B Jung, "Growth of an Intermetallic Compound layer with Sn-3.5Ag-5Bi on Cu and Ni-P/Cu during Aging Treatment", J. Electron. Mater., 32(11), 1195 (2003). https://doi.org/10.1007/s11664-003-0011-8
  4. J. W. Yoon, W. C. Moon and S. B Jung, "Interfacial reaction of ENIG/Sn-Ag-Cu/ENIG sandwich solder joint during isothermal aging", Microelectron. Eng., 83, 2329 (2006). https://doi.org/10.1016/j.mee.2006.10.027
  5. S. W. Kim, J. W. Yoon and S. B. Jung, "Interfacial Reactions and Shear Strengths between Sn-Ag-based Pb-Free Solder Balls and Au/EN/Cu metallization", J. Electron. Mater., 33(10), 1182 (2004). https://doi.org/10.1007/s11664-004-0121-y
  6. J. Glazer, "Microstructure and Mechanical Properties of Pb-Free Solder Alloys for Low-Cost Electronic Assembly: A Review", J. Electron. Mater., 23(8), 693 (1994). https://doi.org/10.1007/BF02651361
  7. J. W. Kim, D. G. Kim, J. M. Koo, J. W. Yoon, S. L. Choi, K. S. Kim, J. D. Nam, H. J. Lee, J. H. Joo and S. B. Jung, "Characterization of Failure Behaviors in Anisotropic Conductive Interconnection", Mater. Trans., 48(5), 1070 (2007). https://doi.org/10.2320/matertrans.48.1070
  8. J. W. Yoon, B. I. Noh, Y. H. Lee, H. S. Lee, S. B. Jung, "Effects of isothermal aging and temperature-humidity treatment of substrate on joint reliability of Sn-3.0Ag-0.5Cu/OSP-finished Cu CSP solder joint", Microelectron. Reliab., 48, 1864 (2008). https://doi.org/10.1016/j.microrel.2008.07.065
  9. K. Zeng and K. N. Tu, "Six cases of reliability study of Pb-free solder joints in electronic packaging technology", Mat. Sci. Eng. A-Struct., 38, 55 (2002).
  10. S. K. Kang, "Lead (Pb)-Free Solders for Electronic Packaging", J. Electron. Mater., 23(8), 701 (1994). https://doi.org/10.1007/BF02651362
  11. C. B. Lee, J. W. Yoon, S. J. Suh and S. B. Jung, "Intermetallic compound layer formation between Sn-3.5 mass %Ag BGA solder ball and (Cu, immersion Au/electroless Ni-P/Cu) substrate", J. Mater. Sci., 14, 487 (2003).
  12. J. W. Yoon, S. W. Kim, J. M. Koo, D. G. Kim and S. B. Jung, "Reliability Investigation and Interfacial Reaction of Ball-Grid-Array Packages Using the Lead-Free Sn-Cu Solder", J. Electron. Mater., 33(10), 1190 (2004). https://doi.org/10.1007/s11664-004-0122-x
  13. J. W. Yoon, S. W. Kim and S. B. Jung, "IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate", J. Alloy. Compd., 392, 247 (2005). https://doi.org/10.1016/j.jallcom.2004.09.045
  14. I. E. Anderson, "Development of Sn-Ag-Cu and Sn-Ag-Cu-X alloys for Pb-free electronic solder applications", Lead-Free Electronic Solders. Springer US, 55 (2007).
  15. J. W. Yoon, Y. H. Lee, D. G. Kim, H. B. Kang, S. J. Suh, C. W. Yang, C. B. Lee, J. M. Jung, C. S. Yoo and S. B. Jung, "Intermetallic compound layer growth at the interface between Sn-Cu-Ni solder and Cu substrate", J. Alloy. Compd., 381, 151 (2004). https://doi.org/10.1016/j.jallcom.2004.03.076
  16. S. H. Kim, J. M. Kim, S. H. Yoo and Y. B. Park, "Effects of PCB surface Finishes on Mechanical Reliability of Sn-1.2Ag-0.7Cu-0.4In Pb-free Solder Joint", J. Microelectron. Packag. Soc., 19(4), 57 (2012). https://doi.org/10.6117/kmeps.2012.19.4.057
  17. W. R. Myung, Y. I. Kim and S. B. Jung, "Mechanical property of the epoxy-contained Sn-58Bi solder with OSP surface finish", J. Alloy. Compd., 615, 411 (2014). https://doi.org/10.1016/j.jallcom.2014.01.078
  18. I. Shohji, T. Yoshida, T. Takahashi and S. Hioki, "Comparison of low-melting lead-free solders in tensile properties with Sn-Pb eutectic solder", J. Mater. Sci., 15, 219 (2004).
  19. C. Fuchs, T. Schreck, M. Kaloudis, "Interfacial reactions between Sn-57Bi-1Ag solder and electroless Ni-P/immersion Au under soild-state aging", J. Mater. Sci., 47, 4036 (2012). https://doi.org/10.1007/s10853-012-6257-x
  20. J. N. Choi, M. K. Ko, S. M. Lee and S. B. Jung, "Effects of Bonding Conditions on Mechanical Strength of Sn-58Bi Lead-Free Solder Joint using Thermo-compression Bonding Method", J. Microelectron. Packag. Soc., 20(2), 17 (2013). https://doi.org/10.6117/kmeps.2013.20.2.017
  21. Standard, J. E. D. E. C., and Solid State Technology Association, "Solder Ball Shear." JEDEC Solid State Technology Association JESD22-B117A October (2006).
  22. J. W. Yoon, C. B. Lee and S. B. Jung, "Interfacial Reactions Between Sn-58 mass% Bi Eutectic Solder and (Cu, Electroless Ni-P/Cu)Substrate", Mater. Trans., 43(8), 1821 (2002). https://doi.org/10.2320/matertrans.43.1821
  23. P. T. Vianco, P. F. Hlava and A. C. Kilgo, "Intermetallic Compound Layer Formation Between Copper and Hot-Dipped 100In, 50In-50Sn, 100Sn, and 63Sn-37Pb Coatings", J. Electron. Mater., 23(7), 583 (1994). https://doi.org/10.1007/BF02653343
  24. J. W. Kim and S. B. Jung, "Failure mechanism of Pb-bearing and Pb-free solder joints under high-speed shear loading", Met. Mater. Int., 16(1), 7 (2010). https://doi.org/10.1007/s12540-010-0007-x
  25. J. M. Koo and S. B. Jung, "Effect of displacement rate on ball shear properties for Sn-37Pb and Sn-3.5Ag BGA solder joints during isothermal aging", Microelectron. Reliab., 47(12), 2169 (2007). https://doi.org/10.1016/j.microrel.2006.09.043

Cited by

  1. Effects of Aging Treatment on Mechanical Properties of Sn-58Bi Epoxy Solder on ENEPIG-Surface-Finished PCB vol.45, pp.11, 2016, https://doi.org/10.1007/s11664-016-4803-z
  2. Lead-free Solder Technology and Reliability for Automotive Electronics vol.22, pp.3, 2015, https://doi.org/10.6117/kmeps.2015.22.3.001
  3. Drop Reliability of Epoxy-contained Sn-58 wt.%Bi Solder Joint with ENIG and ENEPIG Surface Finish Under Temperature and Humidity Test vol.45, pp.7, 2016, https://doi.org/10.1007/s11664-016-4517-2
  4. Microstructures and Drop Impact Test of SAC305, Sn58%Bi and Epoxy Sn58%Bi Solder Joint on the OSP Surface Finished PCB Substrate vol.36, pp.2, 2014, https://doi.org/10.5781/jwj.2018.36.2.3
  5. Suppression of the Growth of Intermetallic Compound Layers with the Addition of Graphene Nano-Sheets to an Epoxy Sn–Ag–Cu Solder on a Cu Substrate vol.12, pp.6, 2014, https://doi.org/10.3390/ma12060936